TECHNOLOGY DESCRIPTION
- Electron affinity (LUMO Level) is the key parameters for the R&D of the organic electronics.
- Conventional Inverse Photo-emission Spectroscopy (IPES) has a concern that target materials are easy to be damaged and Energy resolution is low.
- Low-Energy Inverse Photoemission Spectroscopy (LEIPS) could solve this issue.
International publication number: WO 2015182641
BENEFITS
- Almost no damage onto the target materials
Use of low-energy electron reduces damage to the target material.
- Easy adaption of the standard spectroscopy technology
Emitted photon energy(hν) shifts from VUV to NUV region.
VUV : Vacuum Ultra Violet
NUV : Near Ultra Violet
- Resolution improvement
Detection precision/resolution is improved a factor of 2 (< 0.3 eV)
- available at low vacuum condition
LIMITATIONS
N/A
APPLICATIONS
R&D of organic electronics such as organic light emitting diode and organic photovoltaic cells.
MATERIALS
Readiness Level (TRL)
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STATUS
Current status
EP Patent
AVAILABILITY
Available for
Licensing
INVENTOR / TEAM
Prof. Hiroyuki YOSHIDA